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 Features
* * * * * * * * * * * * * * * * * *
8 Independent Receivers (Rx) 3 Independent Transmitters (Tx) Full TS68K Family Microprocessor Interface Compatibility 16-bit Data-bus ARINC 429 Interface: "1" and "0" Lines, RZ Code Support all ARINC 429 Data Rate Transfer and up to 2.5 Mbit/s Multi Label Capability Parity Control: Odd, Even, No Parity, Interrupt Capability Independent Programmable Frequency for Rx and Tx Channels 8 Messages FIFO per Tx Channel Independent Interrupt Request Line for Rx and Tx Functions Vectored Interrupts Daisy Chain Capability Direct Addressing of all Registers Test Modes Capability 20 MHz Operating Frequency Self-test Capability for Receiver Label Memories and Transmit FiFO Low Power: 400 mW
Description
The TS68C429A is an ARINC 429 controller. It is an enhanced version of the EF 4442 and it is designed to be connected to the new 16- or 32-bit microprocessors, especially these of the Atmel TS68K family.
CMOS ARINC 429 Multichannel Receiver/ Transmitter (MRT) TS68C429A
Screening
* * * MIL-STD-883, class B DESC Drawing 5962-955180
Atmel Standards
Application Note
* A detailed application note is available "AN 68C429A" on request.
R suffix PGA 84 Ceramic Pin Grid Array F suffix CQFP 132 Ceramic Quad Flat Pack
Rev. 2120A-HIREL-08/02
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Hardware Overview
The TS68C429A is a high performance ARINC 429 controller designed to interface primary to the Atmel TS68K family microprocessor in a straight forward fashion (see "Application Notes" on page 33). It can be connected to any TS68K processor family with an asynchronous bus with some additional logic in some cases. As shown in Figure 1, the TS68C429A is divided into five main blocks, the microprocessor interface unit (MIU), the logical control unit (LCU), the interrupt control unit (ICU), the receiver channel unit (RCU) and the transmitter channel unit (TCU). * * * The MIU handles the interface protocol of the host processor. Through this unit, the host sees the TS68C429A as a set of registers. The LCU controls the internal data flow and initializes the TS68C429A. The ICU manages one interrupt line for the RCU and one for the TCU. Each of these two parts has a daisy chain capability. All channels have a dedicated vectored interrupt answer. Receiver channels priority is programmable. The RCU is composed of 8 ARINC receiver channels made of: - - - - * - - - * * a serial to parallel converter to translate the two serial signals (the "1" and "0" in RZ code) into two 16-bit words, a memory to store the valid labels, a control logic to check the validity of the received message, a buffer to keep the last valid received message. a parallel to serial converter to translate the messages into two serial signals (the "1" and "0" in RZ code), a FIFO memory to store eight 32-bit ARINC messages, a control logic to synchronize the message transmitter (parity, gap, speed, etc.).
*
The TCU is composed of three ARINC transmitter channels made of:
Test facility: Rx inputs can be internally connected to TX3 output. Self-test facility: The receiver control label matrix and transmitter FIFO can be tested. This self-test can be used to verify the integrity of the TS68C429A memories.
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Figure 1. Simplified Block Diagram
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Package
Figure 1. Signal Description
Pin Name A0-8 D0-15 Type I I/O
See "Package Mechanical Data" on page 40 and "Terminal Connections" on page 41.
Function Address bus. The address bus is used to select one of the internal registers during a processor read or write cycle. This bi-directional bus is used to receive data from or transmit data to an internal register during a processor read or write cycle. During an interrupt acknowledge cycle, the vector number is given on the lower data bus (D0 - D7). Chip select (active low). This input is used to select the chip for internal register access. Lower data strobe. This input (active low) validates lower data during R/W access (D0-D7). Upper data strobe. This input (active low) validates upper data during R/W access (D8-D15). Read/write. This input defines a data transfer as a read (high) or a write (low) cycle. Data transfer acknowledge. If the bus cycle is a processor read, the chip asserts DTACK to indicate that the information on the data bus is valid. If the bus cycle is a processor write, DTACK acknowledges the acceptance of the data by the MRT. DTACK will be asserted during chip select access (CS asserted) or interrupt acknowledge cycle (IACKTX or IACKRK asserted). Interrupt transmit request. This open drain output signals to the processor that an interrupt is pending from the transmission part of the MRT. There are 6 causes that can generate an interrupt request (2 per channel: FIFO empty and end of transmission). Interrupt transmit acknowledge. If IRQTX is active, the MRT will begin an interrupt acknowledge cycle. The MRT will generate a vector number to the processor which is the highest priority channel requesting interrupt service. Interrupt transmit enable in. This input, together with IEOTX signal, provides a daisy chained interrupt structure for a vectored scheme. IEITX (active low) indicates that no higher priority device is requesting interrupt service. Interrupt transmit enable out. This output, together with IEITX signal, provides a daisy chained interrupt structure for a vectored interrupt scheme. IEOTX (active low) indicates to lower priority devices that neither the TS68C429A nor any highest priority peripheral is requesting an interrupt. Interrupt transmit request. This open drain output signals to the processor that an interrupt is pending from the receiving part of the chip. There are 9 causes that can generate an interrupt request (1 per channel: valid message received, and 1 for bad parity on a received message). Interrupt receive acknowledge. Same function as IACKTX but for receiver part. Interrupt receive enable in. Same function as IEITX but for receiver part. Interrupt receive enable out. Same function as IEOTX but for receiver part. Transmission "1" line of the channel 1. Transmission "0" line of the channel 1. Transmission "1" line of the channel 2. Transmission "0" line of the channel 2. Transmission "1" line of the channel 3. Transmission "0" line of the channel 3. Receiving "1" line of the channel 1. Receiving "0" line of the channel 1. Receiving "1" line of the channel 2
CS LDS UDS R/W DTACK
I I I I O
IRQTX
O
IACKTX
I
IEITX
I
IEOTX
O
IRQRX
O
IACKRX IEIRX IEORX TX1H TX1L TX2H TX2L TX3H TX3L RX1H RX1L RX2H
I I I O O O O O O I I I
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Figure 1. Signal Description (Continued)
Pin Name RX2L RX3H RX3L RX4H RX4L RX5H RX5L RX6H RX6L RX7H RX7L RX8H RX8L RESET VCC/GND CLK-SYS CLK-ARINC Type I I I I I I I I I I I I I I I I I Function Receiving "0" line of the channel 2. Receiving "1" line of the channel 3. Receiving "0" line of the channel 3. Receiving "1" line of the channel 4. Receiving "0" line of the channel 4. Receiving "1" line of the channel 5. Receiving "0" line of the channel 5. Receiving "1" line of the channel 6. Receiving "0" line of the channel 6. Receiving "1" line of the channel 7. Receiving "0" line of the channel 7. Receiving "1" line of the channel 8. Receiving "0" line of the channel 8. This input (active low) will initialize the TS68C429A registers. These inputs supply power to the chip. The VCC is powered at +5 volts and GND is the ground connection. The clock input is a single-phase signal used for internal timing of processor interface. This input provides the timing clock to synchronize received/transmitted messaged.
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Figure 2 illustrates the functional signal groups. Figure 2. Functional Signal Groups Diagram
Scope Applicable Documents
MIL-STD-883
This drawing describes the specified requirements for the ARINC multi channel receiver/transmitter, in compliance either with MIL-STD-863 class B or SMD drawing.
1. MIL-STD-883: test methods and procedures for electronics 2. MIL-STD-38535: general specifications for microcircuits. 3. MIL-STD-1835 microcircuit case outlines. 4. DESC/SMD.
Requirements
General
The microcircuits are in accordance with the applicable document and as specified herein.
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Design and Construction
Terminal Connections Depending on the package, the terminal connections is detailed in "Terminal Connections" on page 41. The circuits are packaged in a hermetically sealed ceramic package which is conform to case outlines of MIL-STD 1835 (when defined): * * PGA 84, CQFP 132.
Package
The precise case outlines are described at the end of this specification ("Package Mechanical Data" on page 40) and into MIL-STD-1835. Special Recommended Conditions for CMOS Devices * CMOS Latch-up The CMOS cell is basically composed of two complementary transistors (a P-channel and an N-channel), and, in the steady state, only one transistor is turned-on. The active P-channel transistor sources current when the output is a logic high and presents a high impedance when the output is a logic low. Thus the overall result is extremely low power consumption because there is no power loss through the active P-channel transistor. Also since only once transistor is determined by leakage currents. Because the basic CMOS cell is composed of two complementary transistors, a parasitic semiconductor controlled rectifier (SCR) formed and may be triggered when an input exceeds the supply voltage. The SCR that is formed by this high input causes the device to become "latched" in a mode that may result in excessive current drain and eventual destruction of the device. Although the device is implemented with input protection diodes, care should be exercised to ensure that the maximum input voltages specification is not exceeded from voltage transients; others may require no additional circuitry. * CMOS/TTL Levels The TS68C429A doesn't satisfy totally the input/output drive requirements of TTL logic devices, see Table 4.
Electrical Characteristics
Table 1. Absolute Maximum Ratings
Symbol VCC VI Pdmax Tcase Tstg Tj Tleads Parameter Supply Voltage Input Voltage Max Power Dissipation M suffix Operating Temperature V suffix Storage Temperature Junction Temperature Lead Temperature Max 5 sec. soldering -40 -55 +85 +150 +160 +270 -55 Test Conditions Min -0.3 -0.3 Max +7.0 +7.0 400 +125 Unit V V mW C C C C C
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Unless otherwise stated, all voltages are referenced to the reference terminal. Table 2. Recommended Condition of Use
Symbol VCC VIL VIH Tcase CL tr(c) tf(c) fc Parameter Supply Voltage Low Level Input Voltage High Level Input Voltage M suffix Operating Temperature V suffix Output Loading Capacitance Clock Rise Time (See Figure 3) Clock Fall Time (See Figure 3) Clock System Frequency (See Figure 3) 0.5 -40 +85 130 5 5 20 Test conditions Min 4.5 -0.5 2.25 -55 Max 5.5 0.8 5.8 +125 Units V V V C C pF ns ns MHz
This device contains protective circuitry against damage due to high static voltages or electrical fields: however, it is advised that normal precautions be taken to avoid application of any voltages higher than maximum-rated voltages to this high-impedance circuit. Reliability of operation is enhanced if unused inputs are tied to an appropriate logic voltage level (e.g., either GND or VCC). Figure 3. Clock Input Timing Diagram
tcyc tCL 2.25V 0.8V tCR tCF tCH
Note:
Timing measurements are referenced to and from a low of 0.8-volt and a high voltage of 2.25 volts, unless otherwise noted. The voltage swing through this range should start outside and pass through the range such that the rise or fall will be linear between 0.8-volt and 2.25 volts.
Table 3. Thermal Characteristics
Package PGA 68 Symbol J-A J-C J-A J-C Parameter Thermal Resistance Junction-to-ambient Thermal Resistance Junction-to-case Thermal Resistance Junction-to-ambient Thermal Resistance Junction-to-case Value 28 2 27 3 Unit C/W C/W C/W C/W
CQFP 132
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Power Considerations The average chip-junction temperature, TJ, in C can be obtained from: TJ = TA + (PD JA) TA = Ambient Temperature, C JA = Package Thermal Resistance, Junction-to-Ambient, C/W PD = PINT + PI/O PINT = ICC x VCC, Watts--Chip Internal Power PI/O = Power Dissipation on Input and Output Pins--User Determined For most applications PI/O < PINT and can be neglected. An approximate relationship between PD and TJ (if PI/O is neglected) is: PD = K: (TJ + 273) Solving equations (1) and (2) for K gives: K = PD (TA + 273) + JA PD2 (3) where K is a constant pertaining to the particular part K can be determined from equation (3) by measuring P D (at equilibrium) for a known T A. Using this value of K, the values of PD and TJ can be obtained by solving equations (1) and (2) iteratively for any value of TA. The total thermal resistance of a package (JA) can be separated into two components, JC and CA, representing the barrier to heat flow from the semiconductor junction to the package (case), surface (JC) and from the case to the outside ambient (CA). These terms are related by the equation: JA = JC + CA (4) JC is device related and cannot be influenced by the user. However, CA is user dependent and can be minimized by such thermal management techniques as heat sinks, ambient air cooling and thermal convection. Thus, good thermal management on the part of the user can significantly reduce CA so that JA approximately equals JC. Substitution of JC for JA in equation (1) will result in a lower semiconductor junction temperature. (2) (1)
Mechanical and Environment Marking
The microcircuits shall meet all mechanical environmental requirements of either MILSTD-883 for class B devices or DESC devices. The document where are defined the marking are identified in the related reference documents. Each microcircuit are legibly and permanently marked with the following information as minimum: * * * * * * Atmel logo Manufacturer's part number Class B identification Date-code of inspection lot ESD identifier if available Country of manufacturing
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Quality Conformance Inspection
DESC/MIL-STD-883
Is in accordance with MIL-M-38510 and method 5005 of MIL-STD-883. Group A and B inspections are performed on each production lot. Group C and D inspections are performed on a periodic basis.
Electrical Characteristics
General Requirements
All static and dynamic electrical characteristics specified for inspection purposes and the relevant measurement conditions are given below: * * Table 4, Table 5: Static electrical characteristics for the electrical variants. Table 6, Table 7, Table 8: Dynamic electrical characteristics.
For static characteristics (Table 4, Table 5), test methods refer to IEC 748-2 method number, where existing. For dynamic characteristics (Table 6, Table 7, Table 8), test methods refer to clause 5.5 of this specification. Table 4. DC Electrical Characteristics With -55C Tcase +125C or -40 Tcase +85C; VCC = 5V 10%.
Symbol VIH VIL VOH VOL IOH IOL ILI IDD Note: Parameter Input High Voltage Input Low Voltage Output High Voltage (except IRQRX, IRQTX: open drain outputs) Output Low Voltage Output Source Current (except IRQRX, IRQTX: open drain outputs) Output Sink Current Input Leakage Current Dynamic Current(1) (Vout = 2.7V) (Vout = 0.5V) (Vin = 0 to VCC) Min 2.25 -0.5 2.7 0.5 -8 8 20 Max VCC + 0.3 0.8 Unit V V V V mA mA A
(Tcase = Tmin VDD 65 mA = Vmax) 1. IDD is measured with all I/O pins at 0V, all input pins at 0V except signals CS, IACKxx, LDS, UDS at 5V and CLK-SYS and CLK-ARINC which run at tcyc mini.
Table 5. Capacitance (TA = 25C)
Symbol Cin Cout Parameter Input Capacitance HI-Z Output Capacitance Max 10 20 Unit pF pF
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Clock Timing
Table 6. Clock System (CLK SYS)
Symbol tcyc S tCLS, tCHS tcrS, tcfS Parameter Clock Period Clock Pulse Width Rise and Fall Times Min 50 20 5 Max 2000 Unit ns ns ns
Table 7. Clock ARINC (CLK ARINC)
Symbol tcyc A tCLA, tCHA Note: tcrA, tcfA 1. tcyc A 4 x tcyc S. Parameter Cycle Time
(1)
Min 200 240
Max 8000
Unit ns ns
Clock Pulse Width Rise and Fall Times
5
ns
AC Electrical Characteristics
Figure 4. Read Cycle
With VCC = 5 VDC 10% VSS = 0 VDC. IEIxx, IEOxx, IACKxx, must be understood as generic signals (xx = RX and TX).
Notes:
1. LDS/UDS can be asserted on the next or previous CLK-SYS period after CS goes low but (4) must be met for the next period. 2. The cycle ends when the first of CS, LDS/UDS goes high.
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Figure 5. Write Cycle
3. LDS/UDS can be asserted on the same or previous CLK-SYS period as CS but (3) and (4) must be met.
Figure 6. Interrupt Cycle (IEIxx = 0)
Notes:
1. If UDS = 1, D15-D8 stay hi-z else D15-D8 drive the bus with a stable unknown value. 2. If IEOxx goes low, neither vector nor DTACK are generated, else IEOxx stays inactive and a vector is generated (D7-D0 and DTACK).
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Figure 7. Interrupt Cycle (IEIxx = 1)
Notes:
1. If UDS = 1, D15-D8 stay hi-z else D15-D8 drive the bus with a stable unknown value. 2. If IEOxx goes low, neither vector nor DTACK are generated, else IEOxx stays inactive and a vector is generated (D7-D0 and DTACK).
Table 8. Timing Characteristic
Number 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Symbol tAVCSL tRWVCSL tDIVDSL tSVCL tCLDKL tCLDOV tDKLDOV tSHDKH tSHDXZ tSHDOZ tILIOL tIKHIOH tIILDKL tIILDOV tSH tDKLSH tSHAH Parameter Address valid to CS low R/W valid to CS low Data in valid to LDS/UDS low CS, LDS/UDS, IACKxx valid to CLK-SYS low CLK-SYS low to DTACK low CLK-SYS low to data out valid DTACK low to data out valid CS or LDS/UDS or IACKxx high to DTACK high CS or LDS/UDS or IACKxx high to DTACK hi-z CS or LDS/UDS or IACKxx high to data out hi-z IEIxx or IACKxx low to IEOxx low IACKxx high to IEOxx high IEIxx low to DTACK low IEIxx low to data out valid CS, IACKxx, LDS/UDS inactive time DTACK low to CS or LDS/UDS or IACKxx high CS or LDS/UDS high to address hold time Min 0 0 0 5 15 0 0 Max 45 50 10 35 50 25 35 40 40 45 T/G(1) T T T T T T G G G G T T T T T G G Unit ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns
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Table 8. Timing Characteristic (Continued)
Number 18 19 20 Note: Symbol tSHRWI tDKLDIH tSHDOH Parameter CS or LDS/UDS high to R/W invalid DTACK low to data in hold time Min 0 0 0 Max T/G(1) G G G Unit ns ns ns
CS or LDS/UDS or IACKxx high data out hold time 1. T/G = Tested/Guaranteed.
Functional Description
Receiver Channel Unit (RCU)
Overview The RCU is composed of 8 ARINC receiver channels and has per channel: * * * * Inputs a serial to parallel converter to translate the two serial signals in two 16-bit words. a memory to store the authorized labels, a control logic to check the validity of the received message. a buffer to keep the last valid received message.
Each receiver channel has two input lines, receiving line high (RxiH) and receiving line low (RXiL) which are not directly compatible with the bipolar modulated ARINC line. This ARINC three-level state signals ("HIGH", "NULL", "LOW") should be demultiplexed to generate the two RZ lines according to Figure 8.
Figure 8.
Description
Each channel has a test mode in which the input signals (RXiH, RXiL), are internally connected to the third Transmit Channel Lines. This selection is done by programming the Test bit in the receiver control register (see "Register Description" on page 17) except this difference, the TS68C429A behaves exactly the same manner in the two modes. The receiver channel block diagram is given in Figure 9. ARINC signals being asynchronous, the RCU first rebuilds the received clock in order to transfer the data within the shift-register and when the Gap-controller has detected the end of the message, tests the message validity according to the criteria listed hereafter.
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To detect the end of the message, the Gap-Controller waits for a Gap after the last received bit. To do so, at each CLK ARINC cycle, a counter is incremented and compared to the content of the Gap-Register which has the user programmed value. If both values are equal, the counter is stopped and an internal end of message signal is generated. This counter is reseted on the falling edge of the rebuilt clock. Figure 9 shows the gap detection principle. When the end of message is detected, the TS68C429A verifies the following points: * * * * * the number of received bits must be 32, if requested the message parity (see "Register Description" on page 17) is compared to the parity bit of the message, the message label must be equal to one of the label stored in the Label Control Matrix, the Buffer is empty (that is: the last message has been read). The corresponding bit in the Status-register (see logical interface unit), has been cleared, when all four conditions are met, the message is transferred from the Shift-register to the Buffer and the corresponding bit is set in the Status-register. If the interrupt mode is enabled (see "General Circuit Control" on page 24) the IRQRX line is activated.
If not, reception of a new message is enabled, see Note. If only the message parity is incorrect, an interrupt can be generated (see "Register Description" on page 17). The Buffer is seen as two 16-bit word registers, the Most Significant Word of the message (MSW) is contained in the lower address, the Less Significant Word of the message (LSW) is contained in the upper address. The MSW should be read first because reading the LSW will release the buffer and allow transfer of a new message from the Shift-register.
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Figure 9. Receiver Channel Block Diagram
Note:
A valid message is stored in the Shift-Reg. until a new message arrives and so may be transferred to the message buffer as soon as the buffer is "freed".
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Figure 10.
Rebuilt clock
CLK-ARINC
Gap register
Synchro counter
End of msg
Register Description Four registers are associated to each receiver channel. These four registers are: a) receiver control b) gap register c) message buffer d) label control matrix * Register Control Register This read/write register controls the function of the related receiver channel:
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The lowest value will give the highest priority. If two channels have the same priority, one of them will never be able to send its interrupt vector to the microprocessor. Each channel must have a unique channel priority order. Figure 11.
USD access
LDS access
15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0
Channel priority order Not used Wrong parity Not used Parity control Label control matrix write enable Label control Test mode Channel enable
Table 9. Register Control Register Description
Bit Bit 15 Bit 14 Bit 13 Bit 12 Bit 11 Bit 10 Bit 9 Bit 8 Bit 7 Function Channel enable Test mode Label control LCMWE label control matrix write enable Parity control Parity control Not used Not used Wrong parity: this feature is enabled only if the self-test register bit 0 is set 1 Not used 0: received message parity is correct if read, reset wrong wrong parity flag if written. 1: an incorrect received message parity has been detected (the corresponding message is lost) (set by hardware). Comments 0: channel is out of service 1: channel is in service 0: external ARINC lines as input (normal operation) 1: third transmitter lines as input (test mode) 0: no control, all the labels are accepted 1: automatic check of the label according to the label control matrix 0: receiving mode (write to the matrix are disabled) 1: programmation mode for labels control matrix 0: even parity check 1: odd parity check 0: parity check is disable 1: parity check is enable
Bit 6
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Table 9. Register Control Register Description
Bit Bit 5 Bit 4 Bit 0 to 3 Function Not used Not used Channel priority: order The lowest value will give the highest priority. Each channel must have a unique channel priority order. If several messages are pending, the interrupt vector will account for highest priority channel. Comments
* Gap Register (Figure 12) The gap register is accessible for writing operations only. It contains the value on which the gap counter will be stopped and will generate the end of the message signal (see "Inputs" on page 14). The value is interpreted as a multiple of the CLK ARINC period. Figure 12. Gap Register Description
The value of the gap register must be chosen so as to generate the end of the message before the minimal gap as defined in the ARINC-429 norm. * Message Buffer The Buffer is made of two 16-bit registers, the Most Significant Word of the message (MSW) is contained in the lower address register, the Least Significant Word of the message (LSW) is contained in the upper address register. For correct behavior, the MSW must be read before the LSW. They are accessible in read mode only and 16-bit access is mandatory. * Label Control Matrix The label control matrix is a 256 x 1 bit memory. There is one memory per channel. The address is driven by the incoming label, the output data is used to validate this incoming message label (see Figure 13). To program this matrix, the LCMWE (label control matrix write enable) bit of the receiver-control-register should be set to "1" to allow the access. At this time, the address is driven by the external address bus and the data are written from the data bus D7 to D0 (one per channel according to Figure 14). Any write to a matrix on which the LCMWE is not set will not have any effect. The label control matrix can be written or read in byte and word mode. In word mode, the state of D15-D8 is unknown. After complete programming of the matrix, the LCMWE bit should be reset to "0" to allow normal receiving mode. A "1" in the memory means that this label is allowed and a "0" means that this label must be ignored.
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Figure 13. Label Control Matrix
Figure 14.
Transmitter Channel Unit (TCU)
Overview The TCU is composed of three ARINC transmit channels and has per channel: * * * Outputs a parallel to serial converter to translate the messages into two serial signals, a FIFO memory to store eight 32-bit ARINC messages, a control logic to synchronize the message transmitter (parity, gap, speed...).
Each transmitter channel has two output lines, Transmit line High (TXiH) and Transmit line Low (TXiL) which are not directly compatible with the bipolar modulated ARINC line. These RZ format lines should be translated by an outside device into ARINC three-level state signal according to Figure 15.
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Figure 15. Transmitter Channel Unit Outputs
Description
The block diagram of a transmit channel is given is given in Figure 16. Only the third channel can be switched to internal lines for test mode, otherwise the channels are identical. The selection of this test mode is done by programming the test bit in the transmitter-control-register (see "Register Description" on page 17). In this test mode the lines TX3H and TX3L are not driven, they are both kept at "0". The transmit frequency is generated by dividing the ARINC clock signal (CLK ARINC) by the value contained in the frequency register. This divided clock synchronizes the shift register which sends the 32-bit word on the lines TXiH and TXiL. The parity is computed and if requested (see "Register Description" on page 17) the parity bit (32nd bit of the message) is modified to have an odd number of "1" in the 32-bit message for odd parity or an even number of "1" in the 32-bit message for even parity. A gap control block generates a gap between the sent messages. The value of this gap is defined by the 5 bits "transmission gap" of the transmitter-control-register, it is given in number of ARINC bit (see "Register Description" on page 17). A FIFO control block manages the messages to be sent. Up to 8 messages can be written into the FIFO. The FIFO is seen as a two 16-bit memory words, the Most Significant Word of the message (MSW) is written in the lower address, the Least Significant Word of the message (LSW) is written in the upper address. The MSW should be written first. The access to the FIFO is 16 bits mandatory. The number of messages within the FIFO is indicated by a counter that can be read through the transmitter-control-register. This counter is incremented when the LSW is written and decremented when the message is transferred to the shift-register. The "Reset FIFO" bit is used to cancel messages within the FIFO. If a transmission is on going, the entire message will be sent. The "reset FIFO" bit remains active until written at 1 by the microprocessor. When the transmitter is disable during a transmission, the out going message is lost. When the FIFO is empty, a bit is set in the status-register (see "General Circuit Control" on page 24). If the interrupt mode is enabled (see "General Circuit Control" on page 24) the IRQTX line is activated. When the transmitter FIFO is empty and when no transmission is on going, the first write access to the FIFO has to be preceded by the following sequence: disable and enable transmission (see Figure 36: First FIFO access).
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Figure 16. Transmitter Channel Block Diagram
Register Description
Three registers are associated to each transmitter channel: * * the frequency register, the transmitter control register,
* the FIFO. * The Frequency Register The frequency register is only accessible for writing operations by the user and contains the frequency divider.
Figure 17. Frequency Register
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The transmission frequency can be computed by dividing the CLK ARINC frequency by the frequency register value. The frequency register must be loaded with a value greater or equal to 2. * The Transmitter Control Register The transmitter control register is accessible for reading and writing operations. Figure 18. Transmitter Control Register
Table 10. Transmission Control Register Description
Bit Bit 15 Function Enable transmission Comments - 0: channel out of service (stops on going transmission) - 1: channel in service - 1 to 0: transition is not allowed at the same time as an 1 to 0 transition of the bit 4 - when the transmitter FIFO is empty and when no transmission is on going, the first write access to the FIFO has to be preceded by the following sequence: reset to 0 and then set to 1 0: normal operating 1: test, output are only driven on internal lines for input testing
Bit 14 Bit 13 to 12 Bus 11 Bit 10 Bit 9 to 5 Bit 4
Test (only 3rd channel) Not used Parity control Parity control Transmission gap Reset FIFO
0: even parity calculation 1: odd parity calculation 0: parity disable, Bit 32 of the message stays unchanged 1: parity enable. Bit 32 of the message will be forced by parity control "transmission gap" which is the delay between two 32-bit ARINC messages (in ARINC bit) - write a 0 in this bit reset the FIFO counter - this bit must be set to 1 before any write in the transmit buffer. - 1 to 0: transition is not allowed at the same time as an 1 to 0 transition of the bit 15 these four bits indicate the available space within the FIFO
Bit 3 to 0
Number of msg
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* FIFO The FIFO is seen as two 16-bit words. The Most Significant Word (MSW) must be written first. The Least Significant Word (LSW) write increments the FIFO counter. Before any write, the user should verify that the FIFO is not full. If the FIFO is full, any write to the FIFO will be lost.
General Circuit Control
Logical Control Unit (LCU) The LCU mainly distributes the clocks and reset within the MRT. The reset signal, active low is an asynchronous signal. When it occurs, all registers are reset to zero except the Label-Control-Matrix which is not initialized and the Status-Register which is set to FC00 (hex). Reset duration must be greater than 4 clk-cyc periods. The LCU contains the Status-register. This read/write register indicates the state of the internal operations. It is also the image of the pending interrupts if they are not masked. Clearing a bit "RX-Channel-i" will cancel the received message and release the Message-buffer for reception of a new message. The "End of TX on channel-i" Is set only when the involved channel FIFO is empty. The format of the Status-Register is given below. Figure 19. Status Register
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Table 11. Description of LCU Status Register
Bit Bit 15, 13, 11 Bit 14, 12, 10 Bit 8 Function FIFO channel 3, 2, 1 empty End of transmission on channel 3, 2, 1 RX wrong parity. This feature is available only if self-test register bit 0 is set to 1. This bit must be reset to 0 by user when needed. Receiving channel 8, 7, 6, 5, 4, 3, 2, 1 Comments 0: FIFO not empty 1: FIFO empty 0: Transmission occurs 1: No transmission actually 0: No wrong parity received 1: At least one receiver has received a message with wrong parity (set by hardware). 0: Waiting for message 1: Received correct message
Bit 7, 6, 5, 4, 3, 2, 1, 0
Microprocessor Interface Unit (MIU)
This interface which is directly compatible with the Atmel TS68K family is based on an asynchronous data transfer. The data exchange is mandatory on 16 bits for access to the FIFO messages (transmitter) and to the message buffer (receiver). For other access it can be on byte on D0-D7 with LDS assertion or an D8-D15 with UDS assertion. Figure 20 and Figure 21 show the read and write flow chart.
Figure 20. Read Cycle Flow Chart
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Figure 21. Write Cycle Flow Chart
Interrupt Control Unit (ICU)
* Daisy Chain The ICU is composed of 2 interrupt blocks with a daisy chain capability (transmitter and receiver blocks). The daisy chain allows more than one circuit to be connected on the same interrupt line. Figure 22 shows the use of a daisy chain. IRQxx, IACKxx, IEIxx, IEOxx must be understood as generic signals. They are IRQTX, IACKTX, IEITX, IEOTX for the transmitter block and IRQRX, IACKRX, IEIRX, IEORX for the receiver block. If IEIxx = 0, no higher device have an interrupt pending on the same line so the interrupt is requested and the IEOxx is forced high to disable lowest devices to generate interrupt. If IEIxx = 1, it waits for the condition IEIxx = 0. When IEIxx is tied high, IEOxx is forced high. The daisy chains can be used to program a priority between receivers and transmitters interrupts when only one interrupt level is needed. An example is given in "Microprocessor Interface" on page 33.
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Figure 22. Interrupt Control Unit Daisy Chain Use
* Vectored Interrupt They are 15 possibilities to generate an interrupt and two lines to handle them. To be more efficient, a unique vector number for each cause is given to the microprocessor as an answer to an IRQ. Figure 23 shows the interrupt acknowledge sequence flow chart. Figure 23. Interrupt Acknowledge Sequence Flow Chart
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* Register Description Any internal status change that induces a bit to be set in the status-register will generate an interrupt if this cause is enabled by the Mask-register and if no highest priority cause is already activated or pending. For the receiver blocks, the priority is programmable (see interrupt vector number description). For the transmitter block, the End-of-transmission has higher priority than FIFO-empty and channel 1 has higher priority than channel 2 that has higher priority than channel 3. The RX wrong parity bit can be set only if self-test register bit 0 is set to 1. The user has to check which receiver has it receiver control register bit 7 set to 1. At the end of the interrupt procedure, the user must reset RX wrong parity bit to 0. RX wrong parity is the highest interrupt priority source for the receiver part of the MRT. * The Mask Register The mask register is accessible for reading and writing operations. The mask register is used to disable interrupt source. The bit order is the same as in the status register. A "0" indicates that this source is disable, a "1" enables an interrupt for this source. Figure 24. Mask Register
* The Base Register The base register is only accessible for writing operations by the user. The base register must be programmed at the initialization phase. It contains the base for the vector generation during an interrupt acknowledge. This allows the use of several peripherals. If not programmed interrupt vector is set to $OF.
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Figure 25. Base Register
* The Interrupt Vector Number During an interrupt acknowledge cycle, an 8-bit vector number is presented to the microprocessor on D0-D7 lines. This vector number corresponds to the interrupt source requesting service. The format of this number is given below. Figure 26.
Self-test Description
A self-test has been implemented for the receiver control label matrix RAM and the transmitter FIFO. This test can be used to guarantee the good behavior of the different MRT's memories.
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Register Description
Figure 27. Self-test Register
The self-test register can be split in three parts: 1. bit 0: Used to enable receiver wrong parity detection. This bit has been implemented to guarantee compatibility with previous designs: 0: Receiver wrong parity detection disable, 1: Receiver wrong parity detection enable. 2. Self-test command: bit 5: Receiver test clock mode: 0: If CLK-SYS is less or equal to 10 MHz, 1: If CLK-SYS is higher than 10 MHz. bit 6: Start transmitter self-test if a 0 to 1 transition is programmed (before a new self-test, the user must reprogram this bit to 0). bit 7: Start receiver Label Control Matrix self-test if a 0 to 1 transition is programmed (before a new self-test, the user must reprogram this bit to 0). 3. Self-test result: bit 8: 0: Transmitter 1 self-test is running, 1: End of Transmitter 1 self-test. bit 9: 0: Transmitter 2 self-test is running, 1: End of Transmitter 2 self-test. bit 10: 0: Transmitter 3 self-test is running, 1: End of Transmitter 3 self-test. bit 11: Result of Transmitter 1 self-test: 0: (if bit 8 is set to 1) self-test pass, 1: Self-test fail. bit 12: Request of Transmitter 2 self-test: 0: (if bit 9 is set to 1) self-test pass,
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1: Self-test fail. bit 13: Result of Transmitter 3 self-test: 0: (if bit 10 is set to 1) self-test pass, 1: Self-test fail. bit 14: 0: Receiver Label Control Matrix self-test is running, 1: End of receiver Label Control Matrix self-test. bit 15: Result of receiver LCM self-test: 0: (if bit 14 is set to 1) self-test pass, 1: Self-test fail. Self-test Use The self-test destroys the content of the tested memory. So, it could be used after system reset, during system initialization. Only one self-test (transmitters and receivers) can be performed after a reset. If the self-test must be restarted, the reset must be activated (then released) before the new self-test start. To program the self-test: 1. If the receiver self-test will be used: set to 1 LCMWE bits (for all receivers). 2. If receiver self-test will be used and CLK-SYS is > 10 MHz: set to self-test register bit 5. 3. Start self-test: set to 1 self-test register bit 6 for Transmitter test, set to 1 self-test register bit 7 for Receiver RAM test. At this point, self-test is running. The test duration is: 710 CLK-SYS periods for Transmitter self-test, 2820 CLK-SYS periods for Receiver RAM test if self-test register bit 5 is 0, 5640 CLK-SYS periods for Receiver RAM test if self-test register bit 5 is 1. To read the self-test result, the user must: 1. poll the self-test register and wait for an end of test set to 1 (bits 8 to 10, bit 14) then, 2. read the self-test register again to have a valid result on bits 11, 12, 13, 15 according to the tests which end at point 1.
Memory MAP
Address 0H 1H 2H 3H 4H 5H 6H 7H Access R/W W R R R/W W R R Register Receiver-control-register Gap-register Message-buffer MSW Message-buffer LSW Receiver-control-register Gap-register Message-buffer MSW Message-buffer LSW
Receiving channel 1
Receiving channel 2
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Memory MAP (Continued)
Address 8H 9H AH BH CH DH EH FH 10H 11H 12H 13H 14H 15H 16H 17H 18H 19H 1AH 1BH 1CH 1DH 1EH 1FH 20H 21H 22H 23H 24H 25H 26H 27H 28H 29H 2AH 2BH 40H 41H 42H 43H 100H to 1FFH Access R/W W R R R/W W R R R/W W R R R/W W R R R/W W R R R/W W R R R/W W W W R/W W W W R/W W W W R/W R/W W R/W R/W Register Receiver-control-register Gap-register Message-buffer MSW Message-buffer LSW Receiver-control-register Gap-register Message-buffer MSW Message-buffer LSW Receiver-control-register Gap-register Message-buffer MSW Message-buffer LSW Receiver-control-register Gap-register Message-buffer MSW Message-buffer LSW Receiver-control-register Gap-register Message-buffer MSW Message-buffer LSW Receiver-control-register Gap-register Message-buffer MSW Message-buffer LSW Transmit-control-register Frequency-register Message-FIFO MSW Message-FIFO LSW Transmit-control-register Frequency-register Message-FIFO MSW Message-FIFO LSW Transmit-control-register Frequency-register Message-FIFO MSW Message-FIFO LSW Status-register Mask-register Base-register Self-test register Label-control-matrix Receiving channels 1-8
Receiving channel 3
Receiving channel 4
Receiving channel 5
Receiving channel 6
Receiving channel 7
Receiving channel 8
Transmission channel 1
Transmission channel 2
Transmission channel 3
MRT address 2CH to 3FH and 44H to FFH do not generate DTACK signal (illegal address). 32
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Application Notes
Microprocessor Interface
Figure 28. Typical Interface with TS68000 (for additional details order the AN 68C429A)
(*) This kind of application can also work with an independant clk
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Figure 29. Typical Interface with 68020/CPU 32 Core Microcontrollers
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Figure 30. Typical Interface with 68302
In this example, receiver interrupts have a higher priority than transmitter interrupts.
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Programs Flow-chart
Figure 31. Initialization after Reset Flow-chart
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Figure 32. Receiver without Interrupt Flow-chart
Figure 33. Receiver with Interrupt Flow-chart
IT START
Read "MSW"
Read "LSW"
IT END
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Figure 34. Transmitter without Interrupt Flow-chart
Figure 35. Transmitter with Interrupt Flow-chart
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Figure 36. First FIFO Access
Preparation for Delivery
Packaging
Microcircuits are prepared for delivery in accordance with MIL-I-38535 or DESC.
Certificate of Compliance Atmel offers a certificate of compliance with each shipment of parts, affirming the products are in compliance either with MIL-STD-883 or DESC and guaranteeing the parameters not tested at temperature extremes for the entire temperature range.
Handling
MOS devices must be handled with certain precautions to avoid damage due to accumulation of static charge. Input protection devices have been designed in the chip to minimize the effect of this static buildup. However, the following handling practices are recommended: * * * * * * Devices should be handled on benches with conductive and grounded surfaces. Ground test equipment, tools and operator. Do not handle devices by the leads. Store devices in conductive foam or carriers. Avoid use of plastic, rubber, or silk in MOS areas. Maintain relative humidity above 50 percent if practical.
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Package Mechanical Data
PGA 84
CQFP 132
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Terminal Connections
84-lead PGA Assignment
132-lead CQFP Assignment
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Ordering Information
Standard Product
Atmel Part Number TS68C429AMR TS68C429AMF TS68C429AVR TS68C429AVF Norms Atmel Standard Atmel Standard Atmel Standard Atmel Standard Package 84-lead PGA 132-lead CQFP 84-lead PGA 132-lead CQFP Temperature Range Tc (C) -55/+125 -55/+125 -40/+85 -40/+85 Detailed Qualification Atmel internal Atmel internal Atmel internal Atmel internal
HI-REL Products
Atmel Part Number TS68C429AMRB/C TS68C429AMFB/C TS68C429ADESCxx TS68C429ADESCxx Norms MIL-STD-883 MIL-STD-883 DESC DESC Package 84-lead PGA 132-lead CQFP 84-lead PGA 132-lead CQFP Temperature Range Tc (C) -55/+125 -55/+125 -55/+125 -55/+125 Detailed Qualification Atmel internal Atmel internal Atmel internal Atmel internal
TS68C429A
MR
1
B/C Screening: B/C = MIL-STD-883 Class B - = internal
Part number
Temperature range: M: -55C/+125C V: -40C/+85C
Lead finish 1: Hot solder dip -: Gold
Package: R = PGA 84 F = CQFP132
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(c) Atmel Corporation 2002. Atmel Corporation makes no warranty for the use of its products, other than those expressly contained in the Company's standard warranty which is detailed in Atmel's Terms and Conditions located on the Company's web site. The Company assumes no responsibility for any errors which may appear in this document, reserves the right to change devices or specifications detailed herein at any time without notice, and does not make any commitment to update the information contained herein. No licenses to patents or other intellectual property of Atmel are granted by the Company in connection with the sale of Atmel products, expressly or by implication. Atmel's products are not authorized for use as critical components in life support devices or systems. ATMEL (R) is the registered trademark of Atmel. Other terms and product names may be the trademarks of others. Printed on recycled paper.
2120A-HIREL-08/02 0M


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